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Jeol JSM-6480LV high-performance, Variable Pressure Analytical Scanning Electron Microscope
| MANUFACTURER | Jeol |
|---|---|
| MODEL | Jeol JSM - 6480LV |
Department of Earth Sciences
| TRAINING | No special training required. |
|---|
| CONTACT 1 | Jim Davy |
|---|---|
| CONTACT 2 | Peter Sammonds |
| Enquire about this item | |
| SITE | Bloomsbury Campus |
Description
Variable Pressure Analytical Scanning Electron Microscope with a high resolution of 3.0nm
Item ID #.
Last Updated: 19th March, 2013
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