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Dimension 3100 AFM
The Dimension 3100 utilises standard and advanced SPM imaging modes for measuring semiconductor wafers, lithography masks, magnetic media, biomaterials, optics and other materials
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Dimension FastScan
The Dimension FastScan uses a low noise FastScan scanner and utilises PeakForce Tapping™ technology to provide new information, faster results and greatly improved ease of use in air or liquid.
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Dimension Icon
The Dimension Icon utilises PeakForce Tapping™ technology to provide new information, faster results and greatly improved ease of use in air or liquid.
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Multimode 8 AFM
The LCN has 3 Bruker MultiMode version 8 at the LCN each equipped with an E scanner or J scanner with heater and uses the unique PeakForce Tapping™ with ScanAsyst technology.
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