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Manufacturer A-Z
Equipment and facilities are available for manufacturers starting with the following letters.
JASCO
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Jasco HPLC Systems
Photodiode array/ fluorescence/ refractive index / electrochemical detectors
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Jeol
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Scanning Electron Microscope (SEM)
Medium resolution tungsten variable vacuum Scanning Electron Microscope
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Field Emission Scanning Electron Microscope (FESEM)
High resolution Field Emission Scanning Electron Microscope
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Transmission Electron Microscope (TEM)
Transmission Electron microscopes (with Digital Image Capture)
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Transmission Electron Microscope (TEM)
Transmission Electron microscopes (with Digital Image Capture)
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JEOL / Oxford Instruments
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Scanning Electron Microscope with Energy Dispersive Spectrometer (EDS-SEM)
The JSM-6610LV low vacuum SEM is a high-performance scanning electron microscope. An innovative X-MacN 50mm Silicon Drift Detector is attached for EDS microanalysis, using the new AZtecEnergy software from Oxford Instruments.
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JPK Instruments
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CellHesion 200 - measurement of cell adhesion & elasticity
Quantitative measurements of cellular adhesion and cell elasticity
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JPK Nanowizard 1 AFM with upright optics
The JPK Nanowizard Atomic Force Microscopes provide high resolution imaging of biological samples using a closed feedback loop to ensure precise positionining in the X,Y and Z dimensions.
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JPK Nanowizard 4 BioScience AFM
The JPK Nanowizard Atomic Force Microscopes provide high resolution imaging of biological samples using a closed feedback loop to ensure precise positionining in the X,Y and Z dimensions.
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JPK Nanowizard Ultra Speed
The LCN is equipped with a JPK Nanowizard Ultra Speed AFM for fast scanning at up to 300Hz line rate in air and liquid at high resolution. It comes equipped with QI mode for quantitative material property mapping and the ability to correlate optical
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